Szczegóły publikacji

Opis bibliograficzny

The influence of copper on microstructure and catalytic properties of ${CeO_{2}}$ thin films deposited by pulsed laser deposition / M. KLIMCZAK-CHMIELOWSKA, R. CHMIELOWSKI, A. KOPIA, J. KUSIŃSKI, Ch. Leroux, S. Villain, S. Saiztek, J. R. Gavarri // High Temperature Material Processes ; ISSN 1093-3611. — 2003 — vol. 7 iss. 3, s. 333–342. — Bibliogr. s. 342, Abstr.

Autorzy (8)

Słowa kluczowe

nano materialsgas sensorscerium dioxidepulsed laser depositionthin films

Dane bibliometryczne

ID BaDAP33372
Data dodania do BaDAP2007-06-23
DOI10.1615/HighTempMatProc.v7.i3.70
Rok publikacji2003
Typ publikacjiartykuł w czasopiśmie
Otwarty dostęptak
Czasopismo/seriaHigh Temperature Material Processes

Abstract

Thin films of cerium dioxide doped with Cu were elaborated by Pulsed Laser Deposition technique from sintered Cu-CeO2 targets. The films were deposited on (100) oriented Si substrates. Scanning and Transmission Electron Microscopy, as well as x-ray diffraction analyses showed correlation between a copper atom fractions and crystalline structure of (Cu, Ce)O-2 thin films. As demonstrated by x-ray diffraction analysis, when the quantity of Cu increases, the (Cu,Ce)O-2 thin films manufactured by laser ablation show a change of the crystal growth preferential orientation (c-axis-orientation) from strong <111> to a strong <200> ones. Infrared Spectrometry showed that, the change of the copper doped ceria crystals (Cu,Ce)O-2 texture has a significant influence on their catalytic behaviour with CH4.

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Structural analyses of $Nd-doped$ $CeO_{2}$ thin films deposited by pulsed laser deposition / A. KOPIA, M. CHMIELOWSKA, Ch. Leroux, J. P. Dallas, J. R. Gavarri, J. KUSIŃSKI // Journal of Microscopy ; ISSN  0022-2720 . — 2006 — vol. 224 pt. 1, s. 49–51. — Bibliogr. s. 51, Summ.
artykuł
#17180Data dodania: 1.9.2004
Structural analyses of ${Cu}$-doped ${CeO_{2}}$ thin films deposited by means of laser ablation / M. KLIMCZAK, A. KOPIA, R. CHMIELOWSKI, J. KUSIŃSKI, I. SULIGA // Materials Chemistry and Physics ; ISSN 0254-0584. — Tytuł poprz.: Materials Chemistry. — 2003 — vol. 81 iss. 2–3, s. 558–561. — Bibliogr. s. 561, Abstr. — XI Conference on Electron Microscopy of solids : Krynica'2002 : May 19–23, 2002