Szczegóły publikacji
Opis bibliograficzny
Structural analyses of $Nd-doped$ $CeO_{2}$ thin films deposited by pulsed laser deposition / A. KOPIA, M. CHMIELOWSKA, Ch. Leroux, J. P. Dallas, J. R. Gavarri, J. KUSIŃSKI // Journal of Microscopy ; ISSN 0022-2720 . — 2006 — vol. 224 pt. 1, s. 49–51. — Bibliogr. s. 51, Summ.
Autorzy (6)
- AGHKopia Agnieszka
- AGHKlimczak-Chmielowska Magdalena
- Leroux Christine
- Dallas Jean-Pierre
- Gavarri J. R.
- AGHKusiński Jan
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 30944 |
|---|---|
| Data dodania do BaDAP | 2007-01-15 |
| Tekst źródłowy | URL |
| DOI | 10.1111/j.1365-2818.2006.01661.x |
| Rok publikacji | 2006 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Journal of Microscopy |
Abstract
CeO2 thin films doped with neodymium oxides for application to gas sensors have been elaborated by the pulsed laser deposition technique. The films were deposited on orientated Si (100) substrates with variable deposition times (t = 90, 180 and 360 s) and molar fractions of Nd2O3 (0, 6.5, 15, 21.5 and 27 at.%). The resulting Nd-CeO2 thin films were characterized by means of X-ray diffraction analysis, scanning electron microscopy and transmission electron microscopy equipped with EDS (Energy Dispersive Spectrometer) microanalysis. From X-ray diffraction analyses, it is clearly established that the texture is modified by Nd additions. The preferred (111) orientations of the CeO2 crystals change into the (200) orientation. The morphology of the CeO2 grains changes from triangles, for pure CeO2 thin films, to spherical grains for Nd-doped films. In addition, cell parameter analyses from X-ray diffraction data show that a partial chemical substitution of Ce by Nd should occur in the face-centred cubic lattice of ceria: this should give rise to Ce1-xNdxO2-z phases with oxygen non-stoichiometry.
