Szczegóły publikacji
Opis bibliograficzny
Structural analyses of ${Cu}$-doped ${CeO_{2}}$ thin films deposited by means of laser ablation / M. KLIMCZAK, A. KOPIA, R. CHMIELOWSKI, J. KUSIŃSKI, I. SULIGA // Materials Chemistry and Physics ; ISSN 0254-0584. — Tytuł poprz.: Materials Chemistry. — 2003 — vol. 81 iss. 2–3, s. 558–561. — Bibliogr. s. 561, Abstr. — XI Conference on Electron Microscopy of solids : Krynica'2002 : May 19–23, 2002
Autorzy (5)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 17180 |
|---|---|
| Data dodania do BaDAP | 2004-09-01 |
| DOI | 10.1016/S0254-0584(03)00074-9 |
| Rok publikacji | 2003 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Materials Chemistry and Physics |
Abstract
The structural analysis of thin cerium dioxides films doped with Cu, elaorated by the laser ablation technique for catalytic and gas sensor application, was the general aim of this study. The influence of process parameters (substrate temperature, time, and volume fraction of Cu) on the thin film morphology has been investigated. The volume fraction of Cu changed in the range 2-7.5 wt.%. The thin films were characterised by scanning electron microscopy (SEM) and X-ray diffraction (XRD) analyses. (C) 2003 Elsevier Science B.V. All rights reserved.
