Szczegóły publikacji
Opis bibliograficzny
Recording channel parameters influence analysis on time-related X-ray based measurements in CMOS 40 nm / Filip KSIĘŻYC, Piotr KMON // W: MIXDES 2025 [Dokument elektroniczny] : 32nd international conference on Mixed Design of integrated circuits and systems : 26-27 June 2025, Szczecin, Poland / ed. by Wojciech Tylman. — Wersja do Windows. — Dane tekstowe. — Łódź : Lodz University of Technology ; IEEE, cop. 2025. — e-ISBN: 978-83-63578-27-5. — S. 126–130. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 129–130, Abstr. — Publikacja dostępna online od: 2025-07-30
Autorzy (2)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 161040 |
|---|---|
| Data dodania do BaDAP | 2025-07-21 |
| Tekst źródłowy | URL |
| DOI | 10.23919/MIXDES66264.2025.11092114 |
| Rok publikacji | 2025 |
| Typ publikacji | materiały konferencyjne (aut.) |
| Otwarty dostęp |  |
| Wydawcy | Institute of Electrical and Electronics Engineers (IEEE), Politechnika Łódzka |
Abstract
This paper describes the influence analysis of typical detector readout electronics front-end parameters on time-related X-ray based measurements. Here two types of recordings are considered, i.e. the Time over Threshold (ToT) and Time of Arrival (ToA) used for energy and arrival time measurements of incoming particles, respectively. The electronics considered is composed of the core amplifier based on a folded cascode amplifier and the feedback circuit based on the constant current architecture. The recorded channel presented is designed in the CMOS 40nm process. This work provides information on how the precision of time-related measurement depends on the front-end electronics.
