Szczegóły publikacji

Opis bibliograficzny

Design, verification and testing of a readout integrated circuit for hybrid pixel X-ray detectors with in-pixel time measurement functionality in 28 nm CMOS / Łukasz A. KADŁUBOWSKI // W: MIXDES 2023 [Dokument elektroniczny] : 30th international conference on Mixed Design of integrated circuits and systems : 29-30 June 2023, Kraków, Poland. — Wersja do Windows. — Dane tekstowe. — Łódź : Lodz University of Technology ; IEEE, cop. 2023. — Dod. ISBN 978-83-63578-23-7 (CD), 979-8-3503-1352-9 (Print on Demand). — e-ISBN: 978-83-63578-24-4. — S. 116–121. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 121, Abstr.

Autor

Słowa kluczowe

front-end electronics for detector readoutmixed mode designIC testingIC verificationSystem Verilogtime-over-thresholdhybrid pixel detectorsring oscillator

Dane bibliometryczne

ID BaDAP150985
Data dodania do BaDAP2024-01-16
Tekst źródłowyURL
DOI10.23919/MIXDES58562.2023.10203236
Rok publikacji2023
Typ publikacjimateriały konferencyjne (aut.)
Otwarty dostęptak
WydawcyInstitute of Electrical and Electronics Engineers (IEEE), Politechnika Łódzka

Abstract

This paper summarizes the design of a prototype integrated circuit for hybrid pixel X-ray detectors fabricated in 28 nm CMOS technology. The chip consists of 32 pixels with dimensions 50 μ m: × 50 μm each. Each pixel is divided into three sections: a front-end, two-ring oscillators with their frequency control circuits, and a digital part. It offers singlephoton counting functionality as well as in-pixel time measurement. In previous papers, a detailed design of the chip and simulation results were reported, and an approach was described that utilized System Verilog language together with the AMS simulator for the verification of this asynchronous, mixed-mode circuitry. This paper focuses more on testing fabricated chips. It describes a test setup and PCB design and mentions how the prior System Verilog verification approach helped with the development of a testing software. Finally, preliminary measurement results are presented that illustrate the performance of front-end and oscillators.

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