Szczegóły publikacji
Opis bibliograficzny
Contact melting in Ag/Ge layered nanofilms: critical thickness and onset temperature / Alexey A. Minenkov, Sergey I. Bogatyrenko, Aleksandr P. KRYSHTAL // W: NAP-2019 [Dokument elektroniczny] : proceedings of the 2019 IEEE 9th international conference on Nanomaterials: Applications & Properties : Odesa, Ukraine, September 15–20, 2019, Pt. 1 / Ministry of Education and Science of Ukraine, [etc.]. — Wersja do Windows. — Dane tekstowe. — Sumy : Sumy State University ; USA : IEEE, 2019. — Dysk Flash. — e-ISBN: 978-1-7281-2830-6. — S. 01TFC25-1–01TFC25-4. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 01TFC25-4, Abstr. — Abstrakt dostępny online: https://nap.sumdu.edu.ua/index.php/nap/nap2019/paper/view/2940 [2019-10-03]
Autorzy (3)
- Minenkov Alexey
- Bogatyrenko Sergey I.
- AGHKryshtal Oleksandr
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 124931 |
|---|---|
| Data dodania do BaDAP | 2019-10-08 |
| Rok publikacji | 2019 |
| Typ publikacji | materiały konferencyjne (aut.) |
| Otwarty dostęp |  |
| Wydawca | Institute of Electrical and Electronics Engineers (IEEE) |
Abstract
We present the results of a rigorous investigation of contact melting in thin Ag/Ge bilayers fulfilled via ex situ TEM techniques based on tracing the abrupt changes of samples morphology and structure at melting. It has been revealed that the liquid-phase formation in the system at the bulk eutectic temperature takes place only if the silver film mass thickness value is greater than the critical one (≈1.2 nm), which corresponds to ≈8 nm sized Ag nanoparticles. The onset temperature of liquid nuclei formation at the metal-semiconductor interface was estimated to be 200°C.
