Szczegóły publikacji
Opis bibliograficzny
Contact melting in Ag/Ge layered nanofilms: critical thickness and onset temperature / Alexey Minenkov, Aleksandr KRYSHTAL, Sergey Bogatyrenko // W: Microstructure and properties of micro- and nanoscale materials, films and coatings (NAP 2019) : selected articles from the international conference on Nanomaterials: applications and properties / eds. Alexander D. Pogrebnjak, Oleksandr Bondar. — Singapore : Springer Nature Singapore Pte Ltd., cop. 2020. — (Springer Proceedings in Physics ; ISSN 0930-8989 ; vol. 240). — ISBN: 978-981-15-1741-9; e-ISBN: 978-981-15-1742-6. — S. 287–295. — Bibliogr., Abstr. — Publikacja dostępna online od: 2020-01-29
Autorzy (3)
- Minienkov Alexey
- AGHKryshtal Oleksandr
- Bogatyrenko Sergey I.
Dane bibliometryczne
| ID BaDAP | 127353 |
|---|---|
| Data dodania do BaDAP | 2020-02-24 |
| DOI | 10.1007/978-981-15-1742-6_27 |
| Rok publikacji | 2020 |
| Typ publikacji | fragment monografii pokonferencyjnej |
| Otwarty dostęp |  |
| Wydawca | Springer |
| Czasopismo/seria | Springer Proceedings in Physics |
Abstract
We present the results of a rigorous investigation of contact melting in thin Ag/Ge bilayers fulfilled via ex-situ TEM techniques based on tracing the abrupt changes of sample morphology and structure at melting. It has been revealed that the liquid-phase formation in the system at the eutectic temperature takes place only if the silver film mass thickness value is greater than the critical one (≈1.2 nm), which corresponds to ≈8 nm-sized Ag nanoparticles. The onset temperature of liquid nuclei formation at the metal-semiconductor interface was estimated to be 200 °C.
