Szczegóły publikacji
Opis bibliograficzny
Quantification and minimization of disorder caused by focused electron beam induced deposition of cobalt on graphene / J. M. Michalik, S. Roddaro, L. Casado, M. R. Ibarra, J. M. De Teresa // Microelectronic Engineering ; ISSN 0167-9317. — 2011 — vol. 88 iss. 8, s. 2063–2065. — Bibliogr. s. 2065, Abstr. — Publikacja dostępna online od: 2010-12-07. — J. M. Michalik - afiliacja: Universidad de Zaragoza, Spain. — 36th international conference on Micro- and Nano-Engineering (MNE) : 19–22 September 2010 : Genoa, Italy
Autorzy (5)
- Michalik Jan Marek
- Roddaro Stefano
- Casado Laura
- Ibarra Manuel Ricardo
- de Teresa José María
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 96996 |
|---|---|
| Data dodania do BaDAP | 2016-03-30 |
| Tekst źródłowy | URL |
| DOI | 10.1016/j.mee.2010.12.002 |
| Rok publikacji | 2011 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Microelectronic Engineering |
Abstract
Graphene has attracted a lot of attention due to its unique transport properties, including applications in Spintronics. Therefore, one of the key issues is the investigation of the spin polarized transport phenomena, which requires the use of magnetic contacts for electrical measurements. Here we present results of the micro-Raman spectroscopy and in situ transport measurements during the electron beam irradiation and electron beam induced deposition of metallic Co on graphene. We aim to understand the effects caused by the Co deposition on the graphene in order to minimize undesired deterioration and induced disorder. Annealing procedures have been also carried out to recover the initial graphene properties. (C) 2010 Elsevier B.V. All rights reserved.
