Szczegóły publikacji
Opis bibliograficzny
Analysis of stresses and crystal structure in the surface layer of hexagonal polycrystalline materials: a new methodology based on grazing incidence diffraction / Marianna MARCISZKO, Andrzej BACZMAŃSKI, Chedly Braham, Mirosław WRÓBEL, Wilfrid Seiler, Sebastian WROŃSKI, Katarzyna BERENT // Journal of Applied Crystallography ; ISSN 0021-8898. — 2016 — vol. 49 iss. 1, s. 85–102. — Bibliogr. s. 101–102
Autorzy (7)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 96644 |
|---|---|
| Data dodania do BaDAP | 2016-03-07 |
| Tekst źródłowy | URL |
| DOI | 10.1107/S1600576715021810 |
| Rok publikacji | 2016 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Journal of Applied Crystallography |
Abstract
The multireflection grazing-incidence X-ray diffraction (MGIXD) method is commonly used to determine a stress gradient in thin surface layers (about 1-20 mu m for metals). In this article, the development of MGIXD to enable the determination not only of stresses but also of the c/a ratio and the a(0) strain-free lattice parameter in hexagonal polycrystalline materials is presented and tested. The new procedure was applied for the results of measurements performed using a laboratory X-ray diffractometer and synchrotron radiation. The evolution of stresses and lattice parameters with depth was determined for Ti and Ti-alloy samples subjected to different mechanical surface treatments. A very good agreement of the results obtained using three different wavelengths of synchrotron radiation as well as classical X-rays (Cu K alpha radiation) was found.
