Szczegóły publikacji
Opis bibliograficzny
Multireflection grazing incidence diffraction used for stress measurements in surface layers / M. MARCISZKO, A. BACZMAŃSKI, M. WRÓBEL, W. Seiler, C. Braham, J. Donges, M. ŚNIECHOWSKI, K. WIERZBANOWSKI // Thin Solid Films ; ISSN 0040-6090 . — 2013 — vol. 530 spec. iss., s. 81–84. — Bibliogr. s. 84, Abstr. — The sixth Size and Strain conference : Presqu'ile de Giens, France, 17–20 October, 2011
Autorzy (8)
- AGHMarciszko-Wiąckowska Marianna
- AGHBaczmański Andrzej
- AGHWróbel Mirosław
- Seiler Wilfrid
- Braham Chedly
- Donges Jörn
- AGHŚniechowski Maciej
- AGHWierzbanowski Krzysztof
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 72228 |
|---|---|
| Data dodania do BaDAP | 2013-03-11 |
| Tekst źródłowy | URL |
| DOI | 10.1016/j.tsf.2012.05.042 |
| Rok publikacji | 2013 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Thin Solid Films |
Abstract
The geometry based on the multireflection grazing incidence X-ray diffraction can be applied to measure residual stresses. Using this method, it is possible to perform a non-destructive analysis of the heterogeneous stresses for different and well defined volumes below the surface of the sample (range of several mu m). As the result, the average values of stresses weighted by absorption of X-ray radiation are measured. In this work the stress profiles as a function of penetration depth were determined for mechanically polished Al sample. Measurements and verification of the method were performed using classical X-ray diffractometer and synchrotron radiation with different wavelengths. (C) 2012 Elsevier B. V. All rights reserved.
