Szczegóły publikacji
Opis bibliograficzny
Microstructural characterization of nanostructured supersonic sprayed $Ni-Sn$ coatings after wear tests at elevated temperature / Jan KUSIŃSKI, Sławomir KĄC, Kazimierz KOWALSKI, Beata DUBIEL, Stanisław DYMEK, Aleksandra CZYRSKA-FILEMONOWICZ, Sergi Dosta, Jean-Pierre Celis, Emmanuel Georgiou, Paolo Matteazzi // International Journal of Materials Research ; ISSN 1862-5282. — Tytuł poprz.: Zeitschrift für Metallkunde. — 2015 — vol. 106 no. 7, s. 750–757. — Bibliogr. s. 757. — XV International Conference on Electron Microscopy, 15–18 September 2014, Cracow, Poland
Autorzy (10)
- AGHKusiński Jan
- AGHKąc Sławomir
- AGHKowalski Kazimierz
- AGHDubiel Beata
- AGHDymek Stanisław
- AGHCzyrska-Filemonowicz Aleksandra
- Dosta Sergi
- Celis Jean-Pierre
- Georgiou Emmanuel
- Matteazzi Paolo
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 90900 |
|---|---|
| Data dodania do BaDAP | 2015-08-05 |
| Tekst źródłowy | URL |
| DOI | 10.3139/146.111244 |
| Rok publikacji | 2015 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | International Journal of Materials Research |
Abstract
The paper presents results of the wear behavior, as well as the microstructural (scanning and transmission electron microscopy) and compositional (microanalysis with using energy dispersive and X-ray photon emission spectroscopy) characterization of nanostructured Ni-20Sn (wt.%) coatings, deposited on an Inconel 718 substrate by supersonic cold gas spraying at different spraying parameters. Coatings were examined in the as-deposited state and after testing in a linearly reciprocating sliding wear test at room temperature, 200, 400 and 550 degrees C. It was found that the Ni-Sn coatings exhibit superior wear resistance compared to benchmark materials. This is attributed to an appropriate balance of soft (Ni) and to hard (Ni3Sn - intermetallic) phases and to the nanostructure of the matrix, as well as to the presence of an NiO oxide tribo-layer, as revealed by the microanalysis and electron microscopy.
