Szczegóły publikacji
Opis bibliograficzny
New developments of multireflection grazing incidence diffraction / Marianna MARCISZKO, Andrzej BACZMAŃSKI, Mirosław WRÓBEL, Wilfrid Seiler, Chedly Braham, Krzysztof WIERZBANOWSKI // Advanced Materials Research ; ISSN 1022-6680. — 2014 — vol. 996, s. 147–154. — Bibliogr. s. 153–154, Abstr. — 9th European Conference on Residual Stresses : 7–10 July 2014
Autorzy (6)
- AGHMarciszko-Wiąckowska Marianna
- AGHBaczmański Andrzej
- AGHWróbel Mirosław
- Seiler Wilfrid
- Braham Chedly
- AGHWierzbanowski Krzysztof
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 83220 |
|---|---|
| Data dodania do BaDAP | 2014-10-01 |
| Tekst źródłowy | URL |
| DOI | 10.4028/777.scientific.net/AMR.996.147 |
| Rok publikacji | 2014 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Advanced Materials Research |
Abstract
The multireflection grazing incident X-ray diffraction (MGIXD) is used to determine a stress gradient in thin surface layers (about 1-20 mu m for metals). In this work two theoretical developments of this method are presented. The first procedure enables determination of c/a parameter in hexagonal polycrystalline materials exhibiting residual stresses. In the second method, the influence of stacking faults on the experimental data is considered. The results of both procedures were verified using X-rays diffraction.
