Szczegóły publikacji
Opis bibliograficzny
In-depth distribution of stresses measured by multireflection grazing incidence diffraction / MARCISZKO M., STANISŁAWCZYK A., BACZMAŃSKI A., WIERZBANOWSKI K., Seiler W., Braham C., WRÓBEL M., SZARANIEC B. // Materials Science Forum ; ISSN 0255-5476 . — Tytuł poprz.: Diffusion and Defect Monograph Series. — 2014 — vol. 772, s. 143–147. — Bibliogr. s. 147, Abstr. — 6th International Conference on Mechanical Stress Evaluation by Neutrons and Synchrotron Radiation (MECA SENS VI) : Hamburg, Germany, 7–9 September, 2011
Autorzy (8)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 78137 |
|---|---|
| Data dodania do BaDAP | 2013-12-17 |
| Tekst źródłowy | URL |
| DOI | 10.4028/www.scientific.net/MSF.772.143 |
| Rok publikacji | 2014 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Materials Science Forum |
Abstract
The geometry based on the multireflection grazing incidence X-ray diffraction (called the MGIXD method) can be applied to measure residual stresses. Using this method, it is possible to perform a non-destructive analysis of the heterogeneous stresses for different and well defined volumes below the surface of the sample (range of several mu m). As the result the average values of stresses weighted by absorption of X-ray radiation are measured. In this work the stress profile as a function of depth for mechanically polished Ti and Al samples were calculated from MGIXD data using inverse Laplace transform.
