Szczegóły publikacji

Opis bibliograficzny

Fast CMOS binary front end for silicon strip detectors at LHC experiments / J. Kaplon, W. DĄBROWSKI // IEEE Transactions on Nuclear Science ; ISSN  0018-9499 . — 2005 — vol. 52 no. 6 Pt. 2, s. 2713–2720. — Bibliogr. s. 2720, Abstr.

Autorzy (2)

Słowa kluczowe

low noise circuitsfront-end electronicsnoise optimizationnoise modelling

Dane bibliometryczne

ID BaDAP27908
Data dodania do BaDAP2006-06-20
Tekst źródłowyURL
DOI10.1109/TNS.2005.862826
Rok publikacji2005
Typ publikacjiartykuł w czasopiśmie
Otwarty dostęptak
Czasopismo/seriaIEEE Transactions on Nuclear Science

Abstract

We present design and test results of the front-end circuit developed in a 0.25 mu m complementary metal-oxide semiconductor technology. The aim of this work is to study the performance of a deep submicron process in applications for fast binary front ends for silicon strip detectors. The channel comprises a fast transimpedance preamplifier working with an active feedback loop, two stages of the amplifier-integrator circuits providing 22 ns peaking time, and a two-stage differential discriminator. A particular effort has been made to minimize the current and the power consumption of the preamplifier, while keeping the required noise and timing performance. For a detector capacitance of 20 pF noise below 1500 e(-) equivalent noise charge (ENC) has been achieved for 300 mu A bias current in the input transistor, which is comparable with the levels achieved in the past for the front end using a bipolar input transistor. The total supply current of the front end is 600 mu A and the power dissipation is 1.5 mW per channel. The offset spread of the comparator is below 3 mV rms.

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