Szczegóły publikacji

Opis bibliograficzny

Structural analysis of $Sr_{n+1}Ru_{n}O_{3n+1}$ thin films deposited by laser ablation — Analiza struktury cienkich warstw $Sr_{n+1}Ru_{n}O_{3n+1}$ otrzymanych techniką ablacji laserowej / R. CHMIELOWSKI, V. Madigou, M. A. Frémy, M. BLICHARSKI, G. Nihoul // Archives of Metallurgy and Materials / Polish Academy of Sciences. Committee of Metallurgy. Institute of Metallurgy and Materials Science ; ISSN  1733-3490 . — 2006 — vol. 51 iss. 1 spec. iss., s. 83–86. — Bibliogr. s. 86. — MicroCEM : workshop on “Progress in Microstructure Characterization by Electron Microscopy” : 30 September – 2 October 2005, Zakopane, Poland / eds.: Ewa Bełtowska, Marek Faryna, Krzysztof Sztwiertnia ; Polish Academy of Sciences. Committee of Metallurgy. Institute of Metallurgy and Materials Science. Kraków, Poland. — Warszawa, Kraków : PAS, 2006

Autorzy (5)

Słowa kluczowe

FeRAMpulsed laser depositionstrontium ruthenate

Dane bibliometryczne

ID BaDAP27660
Data dodania do BaDAP2006-06-05
Rok publikacji2006
Typ publikacjireferat w czasopiśmie
Otwarty dostęptak
Czasopismo/seriaArchives of Metallurgy and Materials

Abstract

The series of conductive oxides, Srn+1RunO3n+1, has been studied for applications in microelectronics as these oxides could be interesting electrode materials for ferroelectric memories (FeRAM). Sr2RuO4 seems to be an interesting candidate. Thin films of Sr2RuO4 were obtained by pulsed laser deposition on a Si (001) substrate. The influence of deposition times and pulse frequencies on the microstructure and properties of the deposited thin films was analysed. Thin films characterization was done by X-ray diffraction, EDS microanalysis, scanning electron microscopy, high-resolution transmission electron microscopy and conductivity measurements. Most of the films are composed of several oxides of the Srn+1RunO3n+1 series. However, their surface is well-defined and, for some films, the conductivity is interesting for applications. Deposition parameters have strong influence on composition and microstructure of oxides films.

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