Szczegóły publikacji
Opis bibliograficzny
Multiphase $CuO_{z}-CeO_{2-\delta}$ thin films by pulsed laser deposition technique: experimental texture evolutions and kinetics modeling / Magdalena KLIMCZAK-CHMIELOWSKA, Radosław CHMIELOWSKI, Agnieszka KOPIA, Jan KUSIŃSKI, Sylvie Villain, Christine Leroux, Jean-Raymond Gavarri // Thin Solid Films ; ISSN 0040-6090 . — 2004 — vol. 458 iss. 1–2, s. 98–107. — Bibliogr. s. 107, Abstr.
Autorzy (7)
- AGHKlimczak-Chmielowska Magdalena
- AGHChmielowski Radosław
- AGHKopia Agnieszka
- AGHKusiński Jan
- Villain Sylvie
- Leroux Christine
- Gavarri Jean Raymond
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 17181 |
|---|---|
| Data dodania do BaDAP | 2004-09-01 |
| Tekst źródłowy | URL |
| DOI | 10.1016/j.tsf.2003.11.312 |
| Rok publikacji | 2004 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Thin Solid Films |
Abstract
CeO2 thin films for gas sensors doped with Cu were elaborated by pulsed-laser deposition (PLD) technique from Cu-CeO2 targets. The films were deposited on oriented Si substrates for various deposition times. Scanning electron microscopy analyses evidenced correlations between crystalline texture of thin films, copper atom fractions and deposition times. A statistical study of grain sizes and texture allows evaluation of growth rates. From X-ray diffraction analyses, it was clearly established that texture effects are continuously modified as the Cu atom fraction increases: preferred (111) orientations of CeO2 crystals change into (200) orientations. Such morphological effects might be involved by the presence of a CuOz phase, formed during the condensation process and peculiarly associated with the laser deposition technique. A texture parameter R corresponding to the volume ratio of oriented phases is defined. A first modeling of this texture parameter as a function of Cu composition x and deposition time t is proposed. (C) 2003 Elsevier B.V. All rights reserved.
