Szczegóły publikacji
Opis bibliograficzny
SPECTRUM 1k — single pixel counting readout chip with in-pixel energy histogramming / P. KMON, R. KŁECZEK, R. SZCZYGIEŁ // Journal of Instrumentation [Dokument elektroniczny]. — Czasopismo elektroniczne ; ISSN 1748-0221 . — 2025 — vol. 20 iss. 12 art. no. C12024, s. [1], 1–8. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 7–8, Abstr. — Publikacja dostępna online od: 2025-12-19. — 26th International workshop on radiation imaging detectors : Bratislava, Slovakia 6–10 July 2025
Autorzy (3)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 165259 |
|---|---|
| Data dodania do BaDAP | 2026-01-13 |
| Tekst źródłowy | URL |
| DOI | 10.1088/1748-0221/20/12/C12024 |
| Rok publikacji | 2025 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp | |
| Creative Commons | |
| Czasopismo/seria | Journal of Instrumentation |
Abstract
This paper presents the design and characterization of the Spectrum1k ASIC, an advanced CMOS chip for X-ray imaging featuring in-pixel energy histogramming. Fabricated using a 40 nm CMOS process, the chip integrates 960 pixels arranged in a 40 × 24 matrix with a 75 μm pitch, each pixel incorporating a charge sensitive amplifier, a discriminator, a 6-bit analog-to-digital converter (ADC), a 64-cell 12-bit memory, and synthesized control logic. Key performance parameters were measured, including an effective number of bits of 5.4 b, equivalent noise charge of 95 e-RMS, and power consumption per pixel ranging between 48 μW and 81 μW depending on the operating mode. Pixel-to-pixel gain and offset variations were minimized to 6.6% and 1.8%, respectively, using in-pixel trimming circuits. The paper emphasizes the chip's digital control architecture and presents ADC performance verification. These results demonstrate the Spectrum1k's suitability for high-resolution spectral X-ray imaging in medical and industrial applications.