Szczegóły publikacji
Opis bibliograficzny
Influence of $Eu^{3+}$ doping and annealing temperature on structure, luminescence and waveguiding properties of sol-gel derived $TiO_x:SiO_y$ ceramic layers / Magdalena Zięba, Cuma Tyszkiewicz, Radosław Szymon, Sandeep Gorantla, Maciej Krzywiecki, Katarzyna Wojtasik, Jacek NIZIOŁ, Ewa Gondek, Maciej ŚNIECHOWSKI, Paweł Karasiński // Ceramics International ; ISSN 0272-8842 . — Tytuł poprz.: Ceramurgia International ; ISSN: 0390-5519. — 2025 — vol. 51 iss. 30 pt. B, s. 64733–64743. — Bibliogr. s. 64742–64743, Abstr. — Publikacja dostępna online od: 2025-11-14
Autorzy (10)
- Zięba Magdalena
- Tyszkiewicz Cuma
- Szymon Radosław
- Gorantla Sandeep
- Krzywiecki Maciej
- Wojtasik Katarzyna
- AGHNizioł Jacek
- Gondek Ewa
- AGHŚniechowski Maciej
- Karasiński Paweł
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 165174 |
|---|---|
| Data dodania do BaDAP | 2026-01-09 |
| Tekst źródłowy | URL |
| DOI | 10.1016/j.ceramint.2025.11.207 |
| Rok publikacji | 2025 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Ceramics International |
Abstract
Ceramic waveguide layers of 30 %TiOx:70 %SiOywith a moderate refractive index of approximately n ∼1.65 were fabricated using the sol-gel method and dip-coating technique. The layers were doped with europium in concentrations up to 5 mol %. The primary objective of this study was to investigate the effect of europium content and annealing temperature on the optical homogeneity, refractive index, chemical composition, structure, and surface topology of the fabricated layers, as well as their relationship to photoluminescent properties and optical losses. The layers were annealed at temperatures ranging from 500 °C to 800 °C.Structural characterization was carried out using X-ray Photoelectron Spectroscopy, X-ray Diffraction, Raman Spectroscopy, Scanning Electron Microscopy, and High-Resolution Transmission Electron Microscopy. Surface topography was examined using Atomic Force Microscopy. The dispersion of the refractive index was determined by spectroscopic ellipsometry, while the waveguiding properties were evaluated by the m-line method.The results revealed that the presence of europium ions in the 30 %TiOx:70 %SiOylayers enhances both their photoluminescent and waveguiding properties. Regardless of the annealing temperature, the photoluminescence efficiency increases with the europium content, with Eu3+ions being uniformly distributed throughout the 30 %TiOx:70 %SiOyceramic matrix. It was demonstrated that europium ions suppress titania crystallization, thereby improving the smoothness of the waveguide surface and consequently reducing optical losses.For 30 %TiOx:70 %SiOywaveguide layers doped with 5 mol % Eu and annealed at 500 °C, the optical losses were measured to be more than twice as low as in undoped layers. For the same layers annealed at 800 °C, the optical losses were 4 times lower than those of undoped samples. The results indicate that europium-doped 30 %TiOx:70 %SiOyceramic layers are a promising material platform for integrated photonics applications.
