Szczegóły publikacji
Opis bibliograficzny
Low cost sol gel derived silica-titania waveguide films – characterization / Magdalena Zięba, Cuma Tyszkiewicz, Katarzyna Wojtasik, Krystian Pavłov, Paweł Chaber, Ewa Gondek, Jacek NIZIOŁ, Roman Rogoziński, Paweł Kielan, Paweł Karasiński // Optics and Laser Technology ; ISSN 0030-3992. — 2024 — vol. 171 art. no. 110339, s. 1–11. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 10–11, Abstr. — Publikacja dostępna online od: 2023-11-20
Autorzy (10)
- Zięba Magdalena
- Tyszkiewicz Cuma
- Wojtasik Katarzyna
- Pavłov Krystian
- Chaber Paweł
- Gondek Ewa
- AGHNizioł Jacek
- Rogoziński Roman
- Kielan Paweł
- Karasiński Paweł
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 150801 |
|---|---|
| Data dodania do BaDAP | 2023-12-21 |
| Tekst źródłowy | URL |
| DOI | 10.1016/j.optlastec.2023.110339 |
| Rok publikacji | 2024 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Creative Commons | |
| Czasopismo/seria | Optics and Laser Technology |
Abstract
This work reports a study on low-loss waveguide layers for planar evanescent wave sensor applications. Crack-free SiOx:TiOy composite layers with refractive indices of ∼1.65, in the visible spectra range, were fabricated using a sol-gel method and a dip-coating technique. Layers of thickness in the 220–360 nm range were produced in a single coating process. By multiple coatings, SiOx:TiOy composite layers of thickness up to 1000 nm were produced. Fabricated layers demonstrated good waveguide properties in the Vis spectral range. The dispersion characteristics of the developed layers refractive index were determined using the spectroscopic ellipsometry method. Spectrophotometric tests validated their optical homogeneity. Using the Tauc method, the widths of optical band gaps were determined, and their high values (Eg > 3.7 eV) attest to the amorphous nature of the layer material. The FT-IR studies testified to Si-O-Ti bonds, an attribute of amorphous SiOx:TiOy composites. The tests of surface morphology of the SiOx:TiOy layers, using atomic force microscopy, scanning electron microscopy, and optical profilometry, confirmed their high smoothness. Using the m-line method, waveguide properties and optical losses were examined. To facilitate the interpretation of the experimental results, the mode characteristics and the calculated impact of surface morphology of the waveguide layer.
