Szczegóły publikacji
Opis bibliograficzny
Pattern matching workflows for EBSD data analysis: quartz chirality mapping / Grzegorz CIOS, Aimo WINKELMANN, Tomasz TOKARSKI, Piotr BAŁA // Materials Characterization : an International Journal on Materials Structure and Behavior ; ISSN 1044-5803. — 2025 — vol. 224 art. no. 115076, s. 1-5. — Bibliogr. s. 5, Abstr. — Publikacja dostępna online od: 2025-04-23
Autorzy (4)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 159612 |
|---|---|
| Data dodania do BaDAP | 2025-06-03 |
| Tekst źródłowy | URL |
| DOI | 10.1016/j.matchar.2025.115076 |
| Rok publikacji | 2025 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Materials Characterization |
Abstract
Pattern matching approaches to electron backscatter diffraction (EBSD) in the scanning elec-tron microscope (SEM) provide qualitatively new possibilities for the microstructural analysis of chiral non-centrosymmetric phases due to the influence of dynamical electron diffraction effects on the formation of EBSD Kikuchi patterns. In the present study, we analyze the mi-crostructure of polycrystalline α-quartz in an agate mineral sample. We identify characteristic intra-grain inversion domains of different handedness which are well-known from classical po-larized light microscopy. As a result, the handedness-resolved microstructure of quartz can be imaged with the spatial and orientation resolution provided by EBSD in the SEM.
