Szczegóły publikacji
Opis bibliograficzny
A method for calibrating a set of laser profilometers / Centrum Badań i Rozwoju Technologii dla Przemysłu S.A., Warszawa ; wynalazca: ROTTER Paweł, KLEMIATO Maciej, ROSÓŁ Maciej, KNAPIK Dawid, Putynkowski Grzegorz, Kordaczek Rafał, Woźny Krzysztof, Andrysiewicz Wojciech. — Int.Cl.: G01B 11/245(2006.01). — European Patent Office. — Opis zgłoszeniowy wynalazku ; EP4386314A1 ; Opubl. 2024-06-19. — Zgłosz. nr EP23215800A z dn. 2023-12-12
Autorzy (8)
- Rotter Paweł
- Klemiato Maciej
- Rosół Maciej
- Knapik Dawid
- Putynkowski Grzegorz
- Kordaczek Rafał
- Woźny Krzysztof
- Andrysiewicz Wojciech
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 154155 |
|---|---|
| Data dodania do BaDAP | 2024-07-30 |
| Tekst źródłowy | URL |
| Rok publikacji | 2024 |
| Typ publikacji | zgłoszenie patentowe |
| Otwarty dostęp |
Abstract
A method for calibrating a set of laser profilometers, comprising the steps of: providing (41) at least two profilometers (11-14); providing (42) a calibration standard (20) having at least six reference points (21-26); scanning (43) the calibration standard (20) with the profilometers (11-14) such that at least six of the same reference points (21-26) are visible on scans made by at least two of the profilometers (11-14); detecting (44) the position of the reference points (21-26) in the three axes (X, Y, Z) for each profilometer (11-14) on its corresponding scan, and defining their positions relative to the specified profilometer (11-14) in the local coordinate system of the particular profilometer; sorting (45) the scanned reference points (21-26) by assigning a label to each point in such a way that each scan comprises the same labels for the same reference point (21-26); and calculating (46) a transformation matrix for the coordinates of the reference points of each profilometer in order to transform these coordinates from the local coordinate system of each profilometer to the external coordinate system.