Szczegóły publikacji

Opis bibliograficzny

Role of the oxidizing Co-reactant in Pt growth by atomic layer deposition using $MeCpPtMe_{3}$ and $O_{2}/O_{3}/O_{2}$-Plasma / Jin Li, Sylwia KLEJNA, Matthias M. Minjauw, Jolien Dendooven, Christophe Detavernier // Journal of Physical Chemistry. C ; ISSN 1932-7447. — 2024 — vol. 128 iss. 6, s. 2449–2462. — Bibliogr. s. 2460-2462, Abstr. — Publikacja dostępna online od: 2024-01-31

Autorzy (5)

Dane bibliometryczne

ID BaDAP152053
Data dodania do BaDAP2024-04-06
Tekst źródłowyURL
DOI10.1021/acs.jpcc.3c07568
Rok publikacji2024
Typ publikacjiartykuł w czasopiśmie
Otwarty dostęptak
Creative Commons
Czasopismo/seriaJournal of Physical Chemistry, C

Abstract

Atomic layer deposition (ALD) of Pt using MeCpPtMe3 and the O2/O3/O2-plasma (O2*) at 300 °C is investigated with in vacuo X-ray photoelectron spectroscopy (XPS) and density functional theory (DFT) to gain a better understanding of the Pt growth mechanism. Most notably, the chemical state of the surface Pt atoms and the role of surface O species in Pt growth are revealed. In the MeCpPtMe3/O2 process, the surface Pt atoms remain in a metallic Pt0 state throughout the ALD cycle, and the surface O species generated by the O2 exposure only exist as unstable adatoms, desorbing in vacuum. As for the O3/O2* processes, the surface Pt layer is oxidized to a mixture of Pt0, Pt2+O and Pt4+O2 upon O3/O2* exposure and then fully reduced to Pt0 during the precursor exposure. Surface Pt oxides are stable in a vacuum but can be reduced by hydrocarbon vapors. Quantification analysis shows that the O3/O2* processes have a much higher surface O species content than the O2 process after the coreactant exposure, favoring precursor ligand combustion over dehydrogenation in the next precursor exposure and leading to lower surface C density after the precursor pulse. DFT reveals differences in the combustion mechanism for Me vs Cp species, during the metal precursor and coreactant pulses. Importantly, the differences in the surface O content do not significantly affect the growth per cycle. Moreover, the MeCpPtMe3/O2 process with surface O species and a tailored MeCpPtMe3/O2 process without surface O species, both at 300 °C, yield nearly identical growth rates and as-deposited Pt with the same chemical state. This indicates that surface O species present before the precursor exposure have little impact on the overall Pt growth, in contrast to a previous assumption.

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#155826Data dodania: 31.10.2024
The role of the oxidizing Co-reactant in Pt growth by atomic layer deposition using $MeCpPtMe_3$ and $O_2/O_3/O_2$-plasma / Jin Li, S. KLEJNA, M. Minjauw, J. Dendooven, C. Detavernier // W: ALD/ALE [Dokument elektroniczny] : AVS 24th international conference on Atomic Layer Deposition : 11th international Atomic Layer Etching workshop : August 4-7, 2024, Helsinki, Finland : book of abstracts. — Wersja do Windows. — Dane tekstowe. — [USA : AVS], [2024]. — S. 117–118. — Wymagania systemowe: Adobe Reader. — Tryb dostępu: https://ald2024.avs.org/wp-content/uploads/2024/04/Abstract-B... [2024-10-07]. — Bibliogr. s. 118
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