Szczegóły publikacji
Opis bibliograficzny
Use of electron backscatter diffraction patterns to determine the crystal lattice. Pt. 2, Offset corrections / Gert Nolze, Tomasz TOKARSKI, Łukasz RYCHŁOWSKI // Journal of Applied Crystallography ; ISSN 0021-8898. — 2023 — vol. 56 pt. 2, s. 361-366. — Bibliogr. s. 366, Abstr. — Publikacja dostępna online od: 2023-02-24
Autorzy (3)
- Nolze Gert
- AGHTokarski Tomasz
- AGHRychłowski Łukasz
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 150439 |
|---|---|
| Data dodania do BaDAP | 2023-12-18 |
| Tekst źródłowy | URL |
| DOI | 10.1107/S1600576723000146 |
| Rok publikacji | 2023 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Creative Commons | |
| Czasopismo/seria | Journal of Applied Crystallography |
Abstract
A band width determination using the first derivative of the band profile systematically underestimates the true Bragg angle. Corrections are proposed to compensate for the resulting offset Δa/a of the mean lattice parameters derived from as many Kikuchi band widths as possible. For dynamically simulated Kikuchi patterns, Δa/a can reach up to 8% for phases with a high mean atomic number Z, whereas for much more common low-Z materials the offset decreases linearly. A predicted offset Δa/a = f(Z) is therefore proposed, which also includes the unit-cell volume and thus takes into account the packing density of the scatterers in the material. Since Z is not always available for unknown phases, its substitution by Zmax, i.e. the atomic number of the heaviest element in the compound, is still acceptable for an approximate correction. For simulated Kikuchi patterns the offset-corrected lattice parameter deviation is Δa/a < 1.5%. The lattice parameter ratios, and the angles α, β and γ between the basis vectors, are not affected at all.
