Szczegóły publikacji
Opis bibliograficzny
Use of electron backscatter diffraction patterns to determine the crystal lattice. Pt. 1, Where is the Bragg angle? / Gert Nolze, Tomasz TOKARSKI, Łukasz RYCHŁOWSKI // Journal of Applied Crystallography ; ISSN 0021-8898. — 2023 — vol. 56 pt. 2, s. 349-360. — Bibliogr. s. 360, Abstr. — Publikacja dostępna online od: 2023-02-24
Autorzy (3)
- Nolze Gert
- AGHTokarski Tomasz
- AGHRychłowski Łukasz
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 150438 |
|---|---|
| Data dodania do BaDAP | 2023-12-18 |
| Tekst źródłowy | URL |
| DOI | 10.1107/S1600576723000134 |
| Rok publikacji | 2023 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Creative Commons | |
| Czasopismo/seria | Journal of Applied Crystallography |
Abstract
The derivation of a crystal structure and its phase-specific parameters from a single wide-angle backscattered Kikuchi diffraction pattern requires reliable extraction of the Bragg angles. By means of the first derivative of the lattice profile, an attempt is made to determine fully automatically and reproducibly the band widths in simulated Kikuchi patterns. Even under such ideal conditions (projection centre, wavelength and lattice plane traces are perfectly known), this leads to a lattice parameter distribution whose mean shows a linear offset that correlates with the mean atomic number Z of the pattern-forming phase. The consideration of as many Kikuchi bands as possible reduces the errors that typically occur if only a single band is analysed. On the other hand, the width of the resulting distribution is such that higher image resolution of diffraction patterns, employing longer wavelengths to produce wider bands or the use of higher interference orders is less advantageous than commonly assumed.
