Szczegóły publikacji

Opis bibliograficzny

Developments and application in transmission Kikuchi diffraction / Tomasz TOKARSKI // W: EMAS 2023 [Dokument elektroniczny] : 17th European workshop on Modern developments and applications in microbeam analysis : 7–11 May 2023, Krakow, Poland : book of tutorials and abstracts. — Wersja do Windows. — Dane tekstowe. — Zürich : European Microbeam Analysis Society eV (EMAS), cop. 2023. — Dysk Flash. — e-ISBN: 978-90-8227-6961. — S. 121–134. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 134, Abstr.


Autor


Dane bibliometryczne

ID BaDAP146928
Data dodania do BaDAP2023-05-30
Rok publikacji2023
Typ publikacjimateriały konferencyjne (aut.)
Otwarty dostęptak

Abstract

Transmission Kikuchi diffraction (TKD) is a fairly new technique, significantly improving the spatial resolution of the electron-back scattering diffraction (EBSD) methodology. It combines thin foil samples with the widely available EBSD camera systems allowing for efficient analysis of light materials at the nanoscale. Over approximately ten years, TKD technique has gained more traction, primarily due to the equipment availability and well-developed sample preparation routines. The paper presents a short description of TKD technique, particular physical limitations and geometrical constraints of acquisition setup as well as typical conditions used during analysis. Several papers were published about the technique itself; however, there is almost no information on how to properly set up both the microscope and the camera system to achieve the best results. The goal of the paper is to demonstrate how easily the TKD technique can be employed in a standard laboratory routine resulting in spatial resolution improvement without sacrificing the efficiency of EBSD system.

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High throughput nanoparticle analysis using transmission Kikuchi diffraction : [abstract] / G. CIOS, T. TOKARSKI, P. BAŁA, V.-D. Hodoroaba // W: EMAS 2023 [Dokument elektroniczny] : 17th European workshop on Modern developments and applications in microbeam analysis : 7–11 May 2023, Krakow, Poland : book of tutorials and abstracts. — Wersja do Windows. — Dane tekstowe. — Zürich : European Microbeam Analysis Society eV (EMAS), cop. 2023. — Dysk Flash. — e-ISBN: 978-90-8227-6961. — S. 309–311. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 311
fragment książki
Advanced diffraction mapping of nitride semiconductor thin films and nanostructures : [abstract] / J. Bruckbauer, G. Ferenczi, R. McDermott, K. Hiller, B. Hourahine, A. WINKELMANN, C. Trager-Cowan // W: EMAS 2023 [Dokument elektroniczny] : 17th European workshop on Modern developments and applications in microbeam analysis : 7–11 May 2023, Krakow, Poland : book of tutorials and abstracts. — Wersja do Windows. — Dane tekstowe. — Zürich : European Microbeam Analysis Society eV (EMAS), cop. 2023. — Dysk Flash. — e-ISBN: 978-90-8227-6961. — S. 306–308. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 308. — A. Winkelmann - dod. afiliacja: University of Strathclyde, Glasgow, Great Britain