Szczegóły publikacji
Opis bibliograficzny
Atomic-scale characterization of contact interfaces between thermally self-assembled Au islands and few-layer $MoS_{2}$ surfaces on $SiO_{2}$ / Enrico Gnecco, Arkadiusz Janas, Benedykt R. Jany, Antony George, Andrey Turchanin, Grzegorz CEMPURA, Adam KRUK, Manoj Tripathi, Frank Lee, A. B. Dalton, Franciszek Krok // Applied Surface Science ; ISSN 0169-4332. — Tytuł poprz.: Applications of Surface Science. — 2023 — vol. 616 art. no. 156483, s. 1–6. — Bibliogr. s. 6, Abstr. — Publikacja dostępna online od: 2023-01-19. — A. Kruk, G. Cempura - dod. afiliacja: International Centre of Electron Microscopy for Materials Science AGH
Autorzy (11)
- Gnecco Enrico
- Janas Arkadiusz
- Jany Benedykt R.
- George Antony
- Turchanin Andrey
- AGHCempura Grzegorz
- AGHKruk Adam
- Tripathi Manoj
- Lee Frank
- Dalton A. B.
- Krok Franciszek
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 144969 |
|---|---|
| Data dodania do BaDAP | 2023-02-18 |
| Tekst źródłowy | URL |
| DOI | 10.1016/j.apsusc.2023.156483 |
| Rok publikacji | 2023 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Applied Surface Science |
Abstract
The interaction between metallic nanoparticles and transition metal chalcogenides (TMDs) can realize new functionalities in thriving technologies such as optoelectronics and nanoengineering. Here we have investigated the self-assembly of triangular-shaped crystalline Au nanoislands on MoS2 flakes mechanically exfoliated or grown by chemical vapor deposition (CVD). The density and size of the islands are determined by substrate temperature, deposition flux, and subsurface morphology. The thickness of the MoS2 layers is measured by Raman spectroscopy, which also enables the evaluation of the strain and doping distributions induced by the Au islands. Top and cross-sectional images of the Au-MoS2 interface are obtained by scanning electron microscopy (SEM) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). Sub-nanometer resolution of the Au, Mo and S layers reveals that the MoS2 flakes follow the corrugation of the SiO2 substrate, with flattening and wrinkling effects induced by the growth of the Au islands on top.
