Szczegóły publikacji
Opis bibliograficzny
Erbium-doped sol-gel derived silica-titania films / Magdalena Zięba, Cuma Tyszkiewicz, Katarzyna Wojtasik, Dominik DOROSZ, Paweł Karasiński // W: Integrated photonics platfoms II : 3–7 April 2022, Strasbourg, France ; 9–20 May online / eds. Roel G. Baets, Peter O'Brien, Laurent Vivien. — Washington : Society of Photo-Optical Instrumentation Engineers, cop. 2022. — (Proceedings of SPIE / The International Society for Optical Engineering ; ISSN 0277-786X ; vol. 12148). — ISBN: 978-1-5106-5172-2; e-ISBN: 978-1-5106-5173-9. — S. 1214803-1–1214803-6. — Bibliogr. s. 1214803-6, Abstr. — Publikacja dostępna online od: 2022-05-25
Autorzy (5)
- Zięba Magdalena
- Tyszkiewicz Cuma
- Wojtasik Katarzyna
- AGHDorosz Dominik Jacek
- Karasiński Paweł
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 141939 |
|---|---|
| Data dodania do BaDAP | 2022-09-09 |
| Tekst źródłowy | URL |
| DOI | 10.1117/12.2622299 |
| Rok publikacji | 2022 |
| Typ publikacji | materiały konferencyjne (aut.) |
| Otwarty dostęp |  |
| Wydawca | SPIE - The International Society for Optics and Photonics |
| Czasopismo/seria | Proceedings of SPIE / The International Society for Optical Engineering |
Abstract
In this paper, we presented the technology of erbium-doped SiOx:TiOy films with different concentrations of erbium (0, 2, 4,6 wt.%) were fabricated using the sol-gel method and dip-coating technique. Tetraethyl orthosilicate (Si(OC2H5)4; TEOS) and titania (IV) ethoxide (Ti(OC2H5)4; TET) were used as precursors of silica, and titania, respectively. Erbium(III) nitrate pentahydrate (Er(NO3)3·5H2O) were used as doping sources of Er ions. The influence of erbium concentration on the optical properties were analyzed using monochromatic elipsometry and UV-Vis spectrophotometry. Using the reflectance spectrophotometry method, optical homogeneity of erbium-doped SiOx:TiOy films were confirmed. The optical band gaps (Eg) were estimated from UV-Vis spectrophotometry. The results indicates to slight decrease in crystallite size of erbium-doped SiOx:TiOy films with increasing erbium concentration. Photoluminescence properties in visible region of erbium-doped SiOx:TiOy films have been demonstrated.
