Szczegóły publikacji

Opis bibliograficzny

Single photon counting integrated circuit operating with CdTe pixel detector / Piotr MAJ, Paweł GRYBOŚ, Piotr KMON, Robert SZCZYGIEŁ // W: MIXDES 2017 : Mixed Design of integrated circuits and systems : book of abstracts of 24th international conference : Bydgoszcz, Poland, June 22–24, 2017 / ed. by Andrzej Napieralski. — Łódź : Lodz University of Technology. Department of Microelectronics and Computer Science, cop. 2017. — ISBN do pełnego tekstu. — W bazie Web of Science ISBN: 978-8-3635-7812-1. — ISBN: 978-83-63578-11-4. — S. 95. — Pełny tekst dostępny online: http://ieeexplore-1ieee-1org-1000047oq0060.wbg2.bg.agh.edu.pl/stamp/stamp.jsp?arnumber=8005224 [2017-07-20]. — S. 324–327. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 326–327, Abstr.

Autorzy (4)

Słowa kluczowe

integrated circuitsX-ray detectors

Dane bibliometryczne

ID BaDAP106849
Data dodania do BaDAP2017-08-03
Rok publikacji2017
Typ publikacjimateriały konferencyjne (aut.)
Otwarty dostęptak
WydawcaPolitechnika Łódzka
KonferencjaInternational Conference "Mixed Design of Integrated Circuits and Systems" 2017

Abstract

CdTe detectors are very good candidate for medical X-ray imaging applications, because of their relatively high atomic number and significant progress in their fabrication process during the last decade. For this reason we built a hybrid pixel detector based on CdTe sensor and the UFXC32k integrated circuit designed in CMOS 130 nrn process and operating in a single photon counting mode. The core of the IC is the matrix of 128 x 256 square shaped pixels of 75 mu m pitch. Each pixel contains a charge sensitive amplifier, a shaper, a discriminator, correction circuits and two 14-bit counters. The UFXC32k chip was bump-bonded to a pixel CdTe sensor and characterized using X-ray radiation. The measured equivalent noise charge is equal to 125 e- rms for the gain of 33 mu V/e-. Thanks to a good quality of hump-bonding process we also managed to obtain a satisfactory X-ray radiograms.

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#106835Data dodania: 3.8.2017
Algorithms for elimination of charge sharing effects in single photon counting pixel detectors / Piotr OTFINOWSKI // W: MIXDES 2017 : Mixed Design of integrated circuits and systems : book of abstracts of 24th international conference : Bydgoszcz, Poland, June 22–24, 2017 / ed. by Andrzej Napieralski. — Łódź : Lodz University of Technology. Department of Microelectronics and Computer Science, cop. 2017. — ISBN do pełnego tekstu. — W bazie Web of Science ISBN: 978-8-3635-7812-1. — ISBN: 978-83-63578-11-4. — S. 70. — Bibliogr. s. 70, Abstr. — Pełny tekst dostępny online: https://mixdes.org/downloads/MIXDES2017.pdf [2017-07-20]. — S. 211–214. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 214, Abstr. — W wersji online dod. autor: Aleksandra KRZYŻANOWSKA
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#106855Data dodania: 3.8.2017
Thermal and power delivery considerations of the 65k pixel 3-D integrated radiation imaging module with through-silicon vias / Krzysztof KASIŃSKI // W: MIXDES 2017 : Mixed Design of integrated circuits and systems : book of abstracts of 24th international conference : Bydgoszcz, Poland, June 22–24, 2017 / ed. by Andrzej Napieralski. — Łódź : Lodz University of Technology. Department of Microelectronics and Computer Science, cop. 2017. — ISBN do pełnego tekstu. — W bazie Web of Science ISBN: 978-8-3635-7812-1. — ISBN: 978-83-63578-11-4. — S. 122. — Abstr. — Pełny tekst dostępny online: https://mixdes.org/downloads/MIXDES2017.pdf [2017-07-20]. — S. 435–439. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 439, Abstr.