Szczegóły publikacji
Opis bibliograficzny
High-speed readout solution for single-photon counting ASICs / P. KMON, R. SZCZYGIEŁ, P. MAJ, P. GRYBOŚ, R. KŁECZEK // Journal of Instrumentation [Dokument elektroniczny]. — Czasopismo elektroniczne ; ISSN 1748-0221. — 2016 — vol. 11 art. no. C02057, s. [1], 1–13. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 12–13, Abstr. — Publikacja dostępna online od: 2016-02-18. — Topical workshop on Electronics for particle physics 2015 : September 28th–October 2nd, 2015, Lisbon, Portugal
Autorzy (5)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 96812 |
|---|---|
| Data dodania do BaDAP | 2016-03-17 |
| Tekst źródłowy | URL |
| DOI | 10.1088/1748-0221/11/02/C02057 |
| Rok publikacji | 2016 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Journal of Instrumentation |
Abstract
We report on the analysis, simulations and measurements of both noise and high-count rate performance of a single photon counting integrated circuit called UFXC32k designed for hybrid pixel detectors for various applications in X-ray imaging. The dimensions of the UFCX32k designed in CMOS 130 nm technology are 9.63 mm × 20.15 mm. The integrated circuit core is a matrix of 128×256 squared readout pixels with a pitch of 75 µm. Each readout pixel contains a charge sensitive amplifier (CSA), a shaper, two discriminators and two 14-bit ripple counters. The UFXC32k was bump-bonded to a silicon pixel detector with the thickness of 320 µm and characterized with the X-ray radiation source. The CSA feedback based on the Krummenacher circuit determines both the count rate performance and the noise of the readout front-end electronics. For the default setting of the CSA feedback, the measured front-end electronics dead time is 232 ns (paralyzable model) and the equivalent noise charge (ENC) is equal to 123 el. rms. For the high count rate setting of the CSA feedback, the dead time is only 101 ns and the ENC is equal to 163 el. rms.
