Szczegóły publikacji

Opis bibliograficzny

Fast and precise algorithms for calculating offset correction in single photon counting ASICs built in deep sub-micron technologies / P. MAJ // Journal of Instrumentation [Dokument elektroniczny]. — Czasopismo elektroniczne ; ISSN 1748-0221. — 2014 — vol. 9 art. no. C07009, s. [1], 1–8. — Bibliogr. s. 7–8, Abstr. — 15th international workshop on radiation imaging detectors, 23–27 June 2013, Paris, France

Autor

Słowa kluczowe

simulation methods and programscalibration and fitting methodscluster findingpattern recognitionlarge detector systems performance

Dane bibliometryczne

ID BaDAP86943
Data dodania do BaDAP2015-02-05
Tekst źródłowyURL
DOI10.1088/1748-0221/9/07/C07009
Rok publikacji2014
Typ publikacjireferat w czasopiśmie
Otwarty dostęptak
Czasopismo/seriaJournal of Instrumentation

Abstract

An important trend in the design of readout electronics working in the single photon counting mode for hybrid pixel detectors is to minimize the single pixel area without sacrificing its functionality. This is the reason why many digital and analog blocks are made with the smallest, or next to smallest, transistors possible. This causes a problem with matching among the whole pixel matrix which is acceptable by designers and, of course, it should be corrected with the use of dedicated circuitry, which, by the same rule of minimizing devices, suffers from the mismatch. Therefore, the output of such a correction circuit, controlled by an ultra-small area DAC, is not only a non-linear function, but it is also often non-monotonic. As long as it can be used for proper correction of the DC operation points inside each pixel, it is acceptable, but the time required for correction plays an important role for both chip verification and the design of a big, multi-chip system. Therefore, we present two algorithms: a precise one and a fast one. The first algorithm is based on the noise hits profiles obtained during so called threshold scan procedures. The fast correction procedure is based on the trim DACs scan and it takes less than a minute in a SPC detector systems consisting of several thousands of pixels.

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