Szczegóły publikacji

Opis bibliograficzny

Stress analysis of zirconia studied by Raman spectroscopy at low temperatures / L. Kurpaska, M. Kozanecki, J. J. Jasiński, Maciej SITARZ // Spectrochimica Acta. Part A, Molecular and Biomolecular Spectroscopy ; ISSN 1386-1425. — 2014 — vol. 131, s. 691–695. — Bibliogr. s. 694–695, Abstr.

Autorzy (4)

Słowa kluczowe

oxide scale stresslow temperature studiesRaman spectroscopy

Dane bibliometryczne

ID BaDAP83517
Data dodania do BaDAP2014-09-19
Tekst źródłowyURL
DOI10.1016/j.saa.2014.05.023
Rok publikacji2014
Typ publikacjiartykuł w czasopiśmie
Otwarty dostęptak
Czasopismo/seriaSpectrochimica Acta, Part A, Molecular and Biomolecular Spectroscopy

Abstract

The paper presents effect of low temperature upon location of selected Raman bands. The structural properties of pure zirconium pre-oxidized at 773 K and 873 K have been studied during cooling in the range of temperatures 273 K and 93 K by Raman spectroscopy. Analysis of the Raman band positions for the monoclinic phase of zirconia oxide was performed. Raman spectroscopy has shown that monoclinic phase of zirconia oxide undergoes a continuous band displacement, individual for each studied Raman mode. Registered shift is aimed towards the high frequency direction. Recorded Raman band displacement was employed to study stress state in zirconia oxide films grown on pure zirconium developed during control cooling. Presented results showed a good correlation between different thicknesses of the oxide scale. © 2014 Elsevier B.V. All rights reserved.

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