Szczegóły publikacji

Opis bibliograficzny

Results of tests of three-dimensionally integrated chips bonded to sensors / Grzegorz W. Deptuch, [et al.], Paweł GRYBOŚ, Piotr KMON, [et al.], Piotr MAJ, [et al.], Robert SZCZYGIEŁ, [et al.] // W: 2013 IEEE NSS/MIC [Dokument elektroniczny] : Nuclear Science Symposium & Medical Imaging Conference : October 27 – November 2, Seoul, Korea / guest ed. Yong Choi ; Institute of Electrical and Electronics Engineers. — Wersja do Windows. — Dane tekstowe. — [Piscataway : IEEE], cop. 2013. — 1 dysk optyczny. — e-ISBN: 978-1-4799-3423-2. — S. [1–5]. — Wymagania systemowe: Adobe Reader ; napęd CD-ROM. — Bibliogr. s. [5], Abstr. — G. Deptuch – afiliacja: Fermi National Accelerator Laboratory, USA. — W bazie Web of Science wersja drukowana. — ISBN 978-1-4799-0534-8. — W bazie Web of Science brak afiliacji AGH

Autorzy (11)

Dane bibliometryczne

ID BaDAP81315
Data dodania do BaDAP2014-05-14
DOI10.1109/NSSMIC.2013.6829434
Rok publikacji2013
Typ publikacjimateriały konferencyjne (aut.)
Otwarty dostęptak
Konferencja60th IEEE Nuclear Science Symposium / Medical Imaging Conference / 20th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors

Abstract

The VIPIC1 pixel readout integrated circuit was designed for high timing resolution, pixel based, X-ray Photon Correlation Spectroscopy experiments, typically using 8 keV Xrays at a synchrotron radiation facility. Technical hurdles related to a very aggressive alignment resulted in delays with delivery of 3D bonded wafers that eventually yielded operational devices. Recent improvements in alignment of wafers bonded with the Cu-Cu thermo-compression method and resorting to the CuDBI r bonding method started providing operational devices that were tested and led to the next steps. These were the tests with radioactive sources, emitting X-rays, executed after bonding of individual 3D dies to Silicon pixelated sensors for the first time. Results of these tests are presented.

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artykuł
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Results of tests of three-dimensionally integrated chips bonded to sensors / Grzegorz W. Deptuch, Gabriella Carini, Terence Collier, Paweł GRYBOŚ, Piotr KMON, Ronald Lipton, Piotr MAJ, David P. Siddons, Robert SZCZYGIEŁ, Raymond Yarema // IEEE Transactions on Nuclear Science ; ISSN 0018-9499. — 2015 — vol. 62 no. 1, s. 349–358. — Bibliogr. s. 358, Abstr. — G. Deptuch – afiliacja: Fermi National Accelerator Laboratory, USA
fragment książki
#81322Data dodania: 14.5.2014
Flash ADCS for multichannel integrated systems in submicron technology / Piotr OTFINOWSKI, Paweł GRYBOŚ // W: 2013 IEEE NSS/MIC [Dokument elektroniczny] : Nuclear Science Symposium & Medical Imaging Conference : October 27 – November 2, Seoul, Korea / guest ed. Yong Choi ; Institute of Electrical and Electronics Engineers. — Wersja do Windows. — Dane tekstowe. — [Piscataway : IEEE], cop. 2013. — 1 dysk optyczny. — e-ISBN: 978-1-4799-3423-2. — S. [1–4]. — Wymagania systemowe: Adobe Reader ; napęd CD-ROM. — Bibliogr. s. [4], Abstr. — W bazie Web of Science wersja ISBN 978-1-4799-0534-8