Szczegóły publikacji
Opis bibliograficzny
Broadband measurements of reflection coefficient with the use of Butler matrix / Kamil STASZEK, Sławomir GRUSZCZYŃSKI, Krzysztof WINCZA, Artur RYDOSZ // W: IMOC 2013 [Dokument elektroniczny] : 2013 SBMO, IEEE MTT-S : International Microwave and Optoelectronics Conference : Rio de Janeiro, Brazil, 4–7 August 2013. — Wersja do Windows. — Dane tekstowe. — [Piscataway : IEEE], [2013]. — 1 dysk optyczny. — e-ISBN: 978-1-4799-1397-8. — S. [1–4]. — Wymagania systemowe: Adobe Reader ; napęd CD-ROM. — Bibliogr. s. [4], Abstr. — Tytuł przejęto ze s. tyt.
Autorzy (4)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 75385 |
|---|---|
| Data dodania do BaDAP | 2013-09-04 |
| DOI | 10.1109/IMOC.2013.6646410 |
| Rok publikacji | 2013 |
| Typ publikacji | materiały konferencyjne (aut.) |
| Otwarty dostęp |  |
| Konferencja | 15th SBMO/IEEE MTT-S International Microwave & Optoelectronics Conference |
Abstract
A novel application of a 4 x 4 Butler matrix in a broadband reflectometer is presented. The well-known dedicated multi port has been replaced with a standard 4 x 4 Butler matrix with reflective element connected to the one of its ports. It is shown, that properties of such a network allow for the complex reflection coefficient measurements. In order to broaden measurement frequency range, a simple modification of a calibration procedure is proposed. The presented system has been verified experimentally by the measurement of reflection coefficients of three shorted attenuators in frequency range 1 - 5 GHz. The measurements have been compared with ones obtained with the use of commercial VNA, showing good agreement.
