Szczegóły publikacji

Opis bibliograficzny

Fractal behaviour of diffraction pattern of Thue-Morse sequence / Janusz WOLNY, Anna WNĘK, Jean-Louis Verger-Gaugry // Journal of Computational Physics ; ISSN 0021-9991. — 2000 — vol. 163 iss. 2, s. 313–327. — Bibliogr. s. 327. — Publikacja dostępna online od: 2002-05-25

Autorzy (3)

Słowa kluczowe

combinatorics on wordsautomata sequencesstructure factoraperiodic structuresaverage unit cellThue-Morse sequencefractalsFourier transformsingular continuous diffraction patternstructure of quasicrystals

Dane bibliometryczne

ID BaDAP7308
Data dodania do BaDAP2002-01-03
Tekst źródłowyURL
DOI10.1006/jcph.2000.6563
Rok publikacji2000
Typ publikacjiartykuł w czasopiśmie
Otwarty dostęptak
Czasopismo/seriaJournal of Computational Physics

Abstract

The Thue-Morse sequence is an example of an aperiodic structure with a singular continuous contribution to the diffraction pattern. Many satellites observed near the main diffraction peaks have been indexed and their intensities have been numerically calculated. Details of such a calculation are presented for satellite peaks indexed by 1/3. An average-unit-cell approach was successfully used to describe probabilities of atomic displacements from the points of the reference lattice. For a certain parameterisation of such probabilities, the results of fairly simple integer calculations could be easily generalised, For some defined sets of points, the analytical expressions for diffraction intensities were found and tested numerically on a wide range of scattering vectors and for up to 2(32) atoms.

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artykuł
#86922Data dodania: 13.1.2015
On the growth rate of words in generalized Thue-Morse sequence / Magdalena FORYŚ // International Journal of Computer Mathematics ; ISSN 0020-7160. — 2014 — vol. 91 iss. 8, s. 1627–1634. — Bibliogr. s. 1634
artykuł
#7265Data dodania: 17.12.2001
Average unit-cell approach to diffraction on Thue-Morse sequence and decorated quasicrystals / Janusz WOLNY, Anna WNĘK, Jean-Louis Verger-Gaugry, Lucjan PYTLIK // Materials Science and Engineering. A, Structural Materials: Properties, Microstructure and Processing ; ISSN 0921-5093. — 2000 — vol. 294–296, s. 381–384. — Bibliogr. s. 384, Abstr.