Szczegóły publikacji
Opis bibliograficzny
A readout system for position sensitive measurements of X-ray using silicon strip detectors / W. DĄBROWSKI, W. BIAŁAS, P. GRYBOŚ, M. IDZIK, J. KUDŁATY // Nuclear Instruments & Methods in Physics Research. Section A, Accelerators, spectrometers, detectors and associated equipment ; ISSN 0168-9002. — 2000 — vol. 442 nos. 1–3, s. 346–354. — Bibliogr. s. 354, Abstr. — Beaune 99 : new developments in photodetection : proceedings of the 2nd international conference : Beaune, France, June 21–25, 1999 / eds. Ph. Bourgeois, J. P. Peigneux. — Amsterdam [etc.] : Elsevier, 2000
Autorzy (5)
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 7272 |
|---|---|
| Data dodania do BaDAP | 2001-12-17 |
| Tekst źródłowy | URL |
| DOI | 10.1016/S0168-9002(99)01248-6 |
| Rok publikacji | 2000 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp | |
| Czasopismo/seria | Nuclear Instruments & Methods in Physics Research, Section A, Accelerators Spectrometers, Detectors and Associated Equipment |
Abstract
In this paper we describe the development of a readout system for X-ray measurements using silicon strip detectors. The limitation concerning the inherent spatial resolution of silicon strip detectors has been evaluated by Monte Carlo simulation and the results are discussed. The developed readout system is based on the binary readout architecture and consists of two ASICs: RX32 front-end chip comprising 32 channels of preamplifiers, shapers and discriminators, and COUNT32 counter chip comprising 32 20-bit asynchronous counters and the readout logic. This work focuses on the design and performance of the front-end chip. The RX32 chip has been optimised fora low detector capacitance, in the range of 1-3 pF, and high counting rate applications. It can be used with DC coupled detectors allowing the leakage current up to a few nA per strip. For the prototype chip manufactured in a CMOS process all basic parameters have been evaluated by electronic measurements. The noise below 140 er rms has been achieved for a detector capacitance of 2 pF and a counting rate of 100 kHz per channel. The performance of the chip is demonstrated by measurements of complex X-ray spectra using a silicon diode array and a silicon strip detector.