Szczegóły publikacji
Opis bibliograficzny
Total reflection X-ray fluorescence attachment module modified for analysis in vacuum / P. Wobrauschek, C. Streli, P. Kregsamer, F. Meirer, C. Jokubonis, A. Markowicz, D. WĘGRZYNEK, E. Chinea-Cano // Spectrochimica Acta. Part B, Atomic spectroscopy ; ISSN 0584-8547. — 2008 — vol. 63 iss. 12, s. 1404–1407. — Bibliogr. s. 1407, Abstr. — A. Markowicz - brak afiliacji AGH. D. Węgrzynek - dod. afiliacja: International Atomic Energy Agency, Vienna. — 12th international conference on Total reflection X-ray fluorescence analysis and related methods : June 18–22, 2007 : Trento, Italy
Autorzy (8)
- Wobrauschek P.
- Streli C.
- Kregsamer Peter
- Meirer Florian
- Jokubonis Christoph
- Markowicz A.
- AGHWęgrzynek Dariusz
- Chinea-Cano Ernesto
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 45336 |
|---|---|
| Data dodania do BaDAP | 2009-05-22 |
| Tekst źródłowy | URL |
| DOI | 10.1016/j.sab.2008.10.020 |
| Rok publikacji | 2008 |
| Typ publikacji | referat w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Spectrochimica Acta, Part B, Atomic Spectroscopy |
Abstract
Based on the design of the low cost Total Reflection X-Ray Fluorescence attachment module available since 1986 from Atominstitut (WOBRAUSCHEK-module) which can be attached to existing X-ray equipment, a new version was developed which allows the analysis of samples in vacuum. This design was in particular possible as the Peltier cooled light weight Silicon Drift Detector is following all adjustment procedures for total reflection as angle rotation and linear motion. The detector is mounted through a vacuum feed and O-ring tightening to the small vacuum chamber. The standard 30 mm round quartz, Si-wafer or Plexiglas reflectors are used to carry the samples. The reflectors are placed on the reference plane with the dried sample down looking facing in about 0.5 mm distance the up looking detector window. The reflectors are resting on 3 steel balls defining precisely the reference plane for the adjustment procedure. As the rotation axis of the module is in the plane of the reflector surface, angle dependent experiments can be made to distinguish between film and particulate type contamination of samples. Operating with a Mo anode at 50 kV and 40 mA with a closely attached multilayer monochromator and using a 10 mm(2) KETEK silicon drift detector with 8 pm Be window, a sensitivity of 70 cps/ng for Rb was measured and detection limits of 2 pg were obtained. (C) 2008 Elsevier B.V. All rights reserved.
