Szczegóły publikacji
Opis bibliograficzny
Micro-beam x-ray fluorescence analysis of individual particles with correction for absorption effects / M. BIELEWSKI, D. WĘGRZYNEK, M. LANKOSZ, A. MARKOWICZ, E. Chinea-Cano, S. Akoto Bamford // X-Ray Spectrometry ; ISSN 0049-8246. — 2006 — vol. 35 iss. 4, s. 238–242. — Bibliogr. s. 242. — Publikacja dostępna online od: 2006-07-11. — D. Węgrzynek - dod. afiliacja: International Atomic Energy Agency, Vienna, Austria ; A. Markowicz - afiliacja: International Atomic Energy Agency, Vienna, Austria
Autorzy (6)
- AGHBielewski Marek
- AGHWęgrzynek Dariusz
- AGHLankosz Marek
- Markowicz Andrzej
- Chinea-Cano Ernesto
- Bamford Samuel Akoto
Dane bibliometryczne
| ID BaDAP | 30322 |
|---|---|
| Data dodania do BaDAP | 2006-11-28 |
| Tekst źródłowy | URL |
| DOI | 10.1002/xrs.899 |
| Rok publikacji | 2006 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | X-Ray Spectrometry |
Abstract
A method of correction for absorption effects in micro-beam x-ray fluorescence analysis is described. A fast, energy-dispersive, silicon drift detector (SDD) was used to measure the primary x-ray beam transmitted through the sample. The absorption factors were calculated using the data acquired with the SDD. The possibility of using the coherently, incoherently and multiple scattered primary radiation for determining the mass of individual particles was examined. The proposed methods were validated with the use of NIST K3089 glass micro-spheres of known composition. Copyright (C) 2006 John Wiley & Sons, Ltd.
