Szczegóły publikacji
Opis bibliograficzny
Unconventional applications of Electron Backscattering Diffraction (EBSD) in metallic materials / K. WÓJCIAK, T. TOKARSKI, G. CIOS, A. WINKELMANN, R. Chulist, G. Nolze // Archives of Metallurgy and Materials / Polish Academy of Sciences. Committee of Metallurgy. Institute of Metallurgy and Materials Science ; ISSN 1733-3490 . — 2025 — vol. 70 iss. 4, s. 1619–1626. — Bibliogr. s. 1624–1626, Abstr. — Publikacja dostępna online od: 2025-12-22. — R. Chulist - afiliacja: Institute of Metallurgy and Materials Science, Polish Academy of Sciences, Krakow
Autorzy (6)
- AGHWójciak Karolina
- AGHTokarski Tomasz
- AGHCios Grzegorz
- AGHWinkelmann Aimo
- Chulist Robert
- Nolze Gert
Słowa kluczowe
Dane bibliometryczne
| ID BaDAP | 167842 |
|---|---|
| Data dodania do BaDAP | 2026-06-02 |
| Tekst źródłowy | URL |
| DOI | 10.24425/amm.2025.156241 |
| Rok publikacji | 2025 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Creative Commons | |
| Czasopismo/seria | Archives of Metallurgy and Materials |
Abstract
Electron backscattered diffraction is widely used for phase and orientation imaging of crystalline specimens. Despite the inherent complexity of diffraction images, current analysis methodologies typically focus on the position of Kikuchi bands or direct comparisons between experimental and simulated patterns. These approaches require prior knowledge of the phases to be analyzed, limiting their applicability in certain scenarios. This paper introduces an alternative methodology, crystallographic analysis of lattice metric, which extracts phase and orientation information directly from the registered diffraction pattern without requiring predefined standards. The paper outlines the methodology, discusses limitations, and demonstrates possible application in phase analysis, lattice parameter ratio mapping, and qualitative lattice distortion mapping.
