Szczegóły publikacji
Opis bibliograficzny
Scanning gate microscopy of nonretracing electron-hole trajectories in a normal-superconductor junction / S. MAJI, K. Sowa, M. P. NOWAK // Physical Review. B ; ISSN 2469-9950. — Tytuł poprz.: Physical Review B, Condensed Matter and Materials Physics ; ISSN: 1098-0121. — 2024 — vol. 109 iss. 11 art. no. 115410, s. 115410-1–115410-8. — Bibliogr. s. 115410-6–115410-8, Abstr. — Publikacja dostępna online od: 2024-03-07
Autorzy (3)
Dane bibliometryczne
| ID BaDAP | 152336 |
|---|---|
| Data dodania do BaDAP | 2024-04-16 |
| Tekst źródłowy | URL |
| DOI | 10.1103/PhysRevB.109.115410 |
| Rok publikacji | 2024 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Creative Commons | |
| Czasopismo/seria | Physical Review, B |
Abstract
We theoretically study scanning gate microscopy (SGM) of electron and hole trajectories in a quantum point contact (QPC) embedded in a normal-superconductor (NS) junction. At zero voltage bias, the electrons and holes transported through the QPC form angular lobes and are subject to self-interference, which marks the SGM conductance maps with interference fringes analogously as in normal systems. We predict that for an NS junction at nonzero bias, a beating pattern is to occur in the conductance probed with the use of the SGM technique owing to a mismatch of the Fermi wave vectors of electrons and holes. Moreover, the SGM technique exposes a pronounced disturbance in the angular conductance pattern, as the retroreflected hole does not retrace the electron path due to wave vector difference.
