Szczegóły publikacji
Opis bibliograficzny
Theory of scanning gate microscopy imaging of the supercurrent distribution in a planar Josephson junction / K. KAPEREK, S. Heun, M. Carrega, P. WÓJCIK, M. P. NOWAK // Physical Review. B ; ISSN 2469-9950. — Tytuł poprz.: Physical Review B, Condensed Matter and Materials Physics ; ISSN: 1098-0121. — 2022 — vol. 106 iss. 3 art. no. 035432, s. 035432-1–035432-10. — Bibliogr. s. 035432-8–035432-10, Abstr. — Publikacja dostępna online od: 2022-07-29
Autorzy (5)
- AGHKaperek Kacper
- Heun Stefan
- Carrega Matteo
- AGHWójcik Paweł
- AGHNowak Michał Piotr
Dane bibliometryczne
| ID BaDAP | 141499 |
|---|---|
| Data dodania do BaDAP | 2022-08-31 |
| Tekst źródłowy | URL |
| DOI | 10.1103/PhysRevB.106.035432 |
| Rok publikacji | 2022 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp | |
| Czasopismo/seria | Physical Review, B |
Abstract
We theoretically investigate the mapping of the supercurrent distribution in a planar superconductor-normal-superconductor junction in the presence of a perpendicular magnetic field via the scanning gate microscopy technique. We find that the distribution of counterpropagating supercurrents aligned in Josephson vortices can be mapped by the change in the critical current induced by the tip of the scanning probe if the flux in the junction is set close to the maxima of the Fraunhofer pattern. Instead, when the magnetic field drives the junction to a supercurrent minimum in the Fraunhofer pattern, the superconducting phase adapts, and the tip always increases the supercurrent. The perpendicular magnetic field leads to the formation of Josephson vortices, whose extension for highly transparent junctions depends on the current circulation direction. We show that this leads to an asymmetric supercurrent distribution in the junction and that this can be revealed by scanning gate microscopy. We explain our findings on the basis of numerical calculations for both short- and long-junction limits and provide a phenomenological model for the observed phenomena.