Szczegóły publikacji

Opis bibliograficzny

Influence of image registration process disturbances on accuracy of marker coordinates detection / Joanna IWANIEC, Marek IWANIEC, Antoni KALUKIEWICZ // W: ICMIMT 2018 : 2018 IEEE 9th International Conference on Mechanical and Intelligent Manufacturing Technologies : February 10–13, 2018, Cape Town, South Africa. — [Piscataway] : IEEE Press, cop. 2018. — ISBN: 978-1-5386-4297-9; e-ISBN: 978-1-5386-4298-6. — S. 219–223. — Bibliogr. s. 223, Abstr. — Dod. ISBN: 978-1-5386-4296-2. — Publikacja dostępna online od: 2018-04-19


Autorzy (3)


Słowa kluczowe

Fredholm integral equation of the first kindimage reconstructionkronecker product

Dane bibliometryczne

ID BaDAP114569
Data dodania do BaDAP2018-06-26
Tekst źródłowyURL
DOI10.1109/ICMIMT.2018.8340452
Rok publikacji2018
Typ publikacjimateriały konferencyjne (aut.)
Otwarty dostęptak
WydawcaInstitute of Electrical and Electronics Engineers (IEEE)
Konferencja2018 IEEE 9th International Conference on Mechanical and Intelligent Manufacturing Technologies

Abstract

The paper concerns results of the research into accuracy of estimation of position of marker stuck to the valley ball moving in the three-dimensional space. Identification of marker centre of gravity coordinates was carried out on the basis of images burdened with the motion, out-of-focus and confocal blurs. The problem of image reconstruction on the basis of registered noisy image was described with the use of the Fredholm integral equation of the first kind. Phenomena disturbing the process of image registration were modelled with the use of the noise matrix computed as the Kronecker product of matrices modelling disturbances in the horizontal and vertical directions.

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fragment książki
Accuracy of marker location identification for investigation into mechanics of ball / Joanna IWANIEC, Marek IWANIEC // W: MEMSTECH 2018 [Dokument elektroniczny] : perspective technologies and methods in MEMS design : XIVth international conference : Polyana, Ukraine, April 18–22, 2018 : proceedings = Perspektivnì tehnologìï ì metodi proektuvannâ MEMC (MEMSTECH) : materìali XIV-oï mižnarodnoï naukovo-tehnìčnoï konferencìï : 18–22 kvìtnâ, Polâna, Ukraïna / Ministry of Education and Science of Ukraine, Lviv Polytechnic National University, Ukraine, IEEE Ukraine Section (West) MTT/ED/AP/EP/SSC Societies Joint Chapter. — Wersja do Windows. — Dane tekstowe. — New York : IEEE, cop. 2018. — (International Conference on Perspective Technologies and Methods in MEMS Design ; ISSN 2573-5373). — e-ISBN: 978-1-5386-5880-2. — S. 9–13. — Wymagania systemowe: Adobe Reader. — Bibliogr. s. 13, Abstr. — Dod. ISBN: 978-1-5386-5881-9. — Publikacja dostępna online od: 2018-05-28