Szczegóły publikacji
Opis bibliograficzny
Interedge backscattering in buried split-gate-defined graphene quantum point contacts / Shaohua Xiang, Alina MREŃCA-KOLASIŃSKA, Vaidotas Miseikis, Stefano Guiducci, Krzysztof KOLASIŃSKI, Camilla Coletti, Bartłomiej SZAFRAN, Fabio Beltram, Stefano Roddaro, Stefan Heun // Physical Review. B ; ISSN 2469-9950. — Tytuł poprz.: Physical Review B, Condensed Matter and Materials Physics ; ISSN: 1098-0121. — 2016 — vol. 94 iss. 15, s. 155446-1–155446-9. — Bibliogr. s. 155446-9. — Publikacja dostępna online od: 2016-10-28
Autorzy (10)
- Xiang Shaohua
- AGHMreńca-Kolasińska Alina
- Miseikis Vaidotas
- Guiducci Stefano
- AGHKolasiński Krzysztof
- Coletti Camilla
- AGHSzafran Bartłomiej
- Beltram Fabio
- Roddaro Stefano
- Heun Stefan
Dane bibliometryczne
| ID BaDAP | 102341 |
|---|---|
| Data dodania do BaDAP | 2016-11-28 |
| Tekst źródłowy | URL |
| DOI | 10.1103/PhysRevB.94.155446 |
| Rok publikacji | 2016 |
| Typ publikacji | artykuł w czasopiśmie |
| Otwarty dostęp |  |
| Czasopismo/seria | Physical Review, B |
Abstract
Quantum Hall effects offer a formidable playground for the investigation of quantum transport phenomena. Edge modes can be deflected, branched, and mixed by designing a suitable potential landscape in a two-dimensional conducting system subject to a strong magnetic field. In the present work, we demonstrate a buried split-gate architecture and use it to control electron conduction in large-scale single-crystal monolayer graphene grown by chemical vapor deposition. The control of the edge trajectories is demonstrated by the observation of various fractional quantum resistances, as a result of a controllable interedge scattering. Experimental data are successfully modeled both numerically and analytically within the Landauer-Buttiker formalism. Our architecture is particularly promising and unique in view of the investigation of quantum transport via scanning probe microscopy, since graphene constitutes the topmost layer of the device. For this reason, it can be approached and perturbed by a scanning probe down to the limit of mechanical contact.
